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Microscopy is a powerful technique used to observe and analyze the structure, morphology, and composition of materials at micro and nano-scales. It combines visualization with quantitative analysis, enabling scientists to study samples in great detail
Scanning Electron Microscopy
Scanning Electron Microscopy
A beam of electrons scans the surface of the sample. These electrons hit the sample and bounce back, creating super-detailed 3D images of the surface. Special detectors can also identify the elements in the sample. It's commonly used for studying surface textures, analyzing particle sizes, identifying elements, and failure analysis.
Transmission Electron Microscopy
Transmission Electron Microscopy
A strong electron beam passes through a very thin slice of the sample. The electrons interact with the atoms inside, creating very clear, zoomed-in images of the internal structure at the atomic level. It's commonly used for investigating atomic structures, studying nanoparticles, analyzing defects, and material composition.
Atomic Force Microscopy
Atomic Force Microscopy
A super-sharp needle (probe) moves over the surface of the sample, feeling its bumps and dips. It measures forces between the tip and surface, creating a super-detailed 3D map of the surface. It's commonly used for measuring surface roughness, studying nanoscale features, and testing material properties like stiffness or adhesion.
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